Electron Microscopy
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JEOL JSM-6340F Scanning Electron Microscope
This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer. This instrument is also equipped with an energy dispersive X-ray spectrometer (EDS), smart X-ray element mapping can be carried out. In the low-voltage mode it is capable of imaging a wide variety of uncoated insulating samples.
This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer. This instrument is also equipped with an energy dispersive X-ray spectrometer (EDS), smart X-ray element mapping can be carried out. In the low-voltage mode it is capable of imaging a wide variety of uncoated insulating samples.
- Resolution: 1.2nm
- Accelerating Voltage: 0.5-20keV
- Stage: X=50mm; Y=70mm, Z=25mm
- Tilt Angle: -5潞 to +45潞
- Rotation: 360潞 Endless
- Energy Dispersive X-ray Spectrometer (EDS)
SEM Facility User Rates (Per Hour) | ||||||
听 | External Commercial (profit) | External Academic (non-profit) | Internal | |||
听 | Facility 听Operator | Self 听Operator | Facility 听Operator | Self Operator | Facility Operator | Self Operator |
SEM | $200 | $100 | $130 | $30 | $120 | $20 |
The microscope is located in Higgins 110. For all microscope questions and training, please contact:听Bret Judson.
Please note that all work performed in AV研究所 core facilities and recharge centers should always be appropriately acknowledged.听 If you are publishing or presenting data acquired in AV研究所 core facilities and recharge centers, please include the following statement in the Acknowledgement section of your manuscript/poster/presentation, "The authors would like to thank the Boston College <insert facility name> for assistance with the work presented in this paper/poster/presentation*."
* Delete as appropriate
JEOL 2010F Transmission Electron Microscope
This instrument is an advanced and digitally dedicated transmission electron microscope operating at 200kV with a field-emission gun. It is capable of an ultimate point-to-point resolution of 0.19 nm, with the ability to image lattice fringes at 0.14 nm resolution. It is a multipurpose ultrahigh resolution analytical electron microscope with a wide range of capabilities such as high-resolution image observation, nanoarea X-ray analysis, versatile analysis by convergent-beam electron diffraction, and analysis of the atomic structure and/or bonding state of atoms. With the addition of Energy dispersive X-ray spectrometer (EDS) and Parallel electron energy loss spectrometer (PEELS), the field-emission TEM can also be used as an elemental analysis tool, capable of identifying the elements in areas less than 2 nm in diameter.
- 200 kV, Schottky Field Emission Gun
- Ultra High Resolution Pole Piece (Cs=0.5 mm)
- 0.19 nm Point-to-Point Resolution
- Minimum Beam Size: 0.5 nm
- JEOL Single Tilt Low Background Holder
- JEOL Double Tilt Low Background Holder
- Double Tilt Heating Holder (Maximum Temperature: 1000潞C)
- Specimen Tilt Angle (X axis): 卤20潞
- High Resolution Imaging
- Convergent Beam Electron Diffraction (CBED)
- Energy Dispersive X-Ray Analysis (EDS)
- Electron Energy Loss Spectroscopy (EELS)
TEM Facility User Rates (Per Hour) | ||||||
听 | External Commercial (profit) | External Academic (non-profit) | Internal | |||
听 | Facility 听Operator | Self 听Operator | Facility 听Operator | Self Operator | Facility Operator | Self Operator |
TEM | $250 | $150 | $160 | $60 | $140 | $40 |
The microscope is located in Higgins 030. For all microscope questions and training, please contact:听Bret Judson.
Please note that all work performed in AV研究所 core facilities and recharge centers should always be appropriately acknowledged.听 If you are publishing or presenting data acquired in AV研究所 core facilities and recharge centers, please include the following statement in the Acknowledgement section of your manuscript/poster/presentation, "The authors would like to thank the Boston College <insert facility name> for assistance with the work presented in this paper/poster/presentation*."
* Delete as appropriate